Wet etching of undercut sidewalls in {001}-silicon

被引:2
作者
Frühauf, J [1 ]
Hannemann, B [1 ]
机构
[1] Tech Univ Chemnitz Zwickau, Dept Elect Engn, D-09107 Chemnitz, Germany
关键词
{001}-silicon; wet etching; undercut sidewalls;
D O I
10.1016/S0924-4247(98)00233-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The development of undercut sidewalls along [100] directions of {001}-silicon by a two-step orientation dependent wet etching process is described. Thereby the first step generates vertical {100}-sidewalls in a pure aqueous potassium hydroxide etchant (KOH). The following second step in an etchant consisting of KOH saturated with isopropanol (KOH:IPA) develops slowly etched {101}-faces with undercutting inclination. A principal calculation is given of the expected sidewall dimensions and a comparison is also done with experimental prepared sidewalls. The differences are small. An application is proposed where sidewalls prepared in this way have a function as bending spring or free standing bridge. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:55 / 63
页数:9
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