An equivalent cicuit for CuO modified surface barrier layer capacitors

被引:44
作者
Yang, CF
机构
[1] Department of Electronic Engineering, Chinese Air Force Academy, Kangshan, Kaohsiung, 82012
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 1A期
关键词
liquid phase promoter; insulating boundary layer; dielectric constant; anneal; semiconductive;
D O I
10.1143/JJAP.36.188
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nb2O5-doped (Ba0.8Sr0.2)(Ti0.9Zr0.1)O-3 (BSTZ) is calcined at 1170 degrees C for the complete formation of ABO(3) phases. After calcination, CuO is added to BSTZ as a liquid phase promoter and an insulating boundary layer material. After sintering in a reducing atmosphere, the fired ceramics are cooled to an annealing temperature, then the cermics are annealed in air. The loss tangents of the fabricated ceramics increase with amount of CuO addition, but the maximum grain growth and maximum dielectric constant will reveal in 1 wt% CuO-added BSTZ. For BSTZ with different amount of CuO addition, the effective dielectric constant increases with the sintering temperature and decreases critically with annealing temperature and annealing time. When 60 min is used as annealing time, lower the annealing temperature is, more broad dielectric constant-temperature curves are. It is believed that the semiconductive BSTZ, which is residual in the center of the reoxidized BSTZ, will dominate the result.
引用
收藏
页码:188 / 193
页数:6
相关论文
共 12 条
[1]   EQUIVALENT-CIRCUIT MODEL IN GRAIN-BOUNDARY BARRIER LAYER CAPACITORS [J].
CHIOU, BS ;
LIN, ST ;
DUH, JG ;
CHANG, PH .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1989, 72 (10) :1967-1975
[2]   MICROSTRUCTURE OF SRTIO3 BOUNDARY-LAYER CAPACITOR MATERIAL [J].
FRANKEN, PEC ;
VIEGERS, MPA ;
GEHRING, AP .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1981, 64 (12) :687-690
[3]   MICROSTRUCTURES OF SRTIO3 INTERNAL BOUNDARY-LAYER CAPACITORS DURING AND AFTER PROCESSING AND RESULTANT ELECTRICAL-PROPERTIES [J].
FUJIMOTO, M ;
KINGERY, WD .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1985, 68 (04) :169-173
[4]  
GOODMAN G, 1981, ADV CERAM, V1, P215
[5]  
IGARASHI H, ADV CERAM, V1, P272
[6]  
KINGERY WD, 1975, INTRO CERAMICS, P946
[7]  
KINGGERY WD, 1975, INTRO CERAMICS, P498
[8]  
LEVINSON LM, 1981, ADV CERAM, V1, P272
[9]  
WAKU S, 1970, REV ELEC COMMUN LAB, V18, P681
[10]  
WAKU S, 1967, REV ELEC COMMUN LAB, V15, P689