Imaging the dimers in Si(111)-(7x7)

被引：36

作者：

Bengu, E ^{[1
]}

Plass, R ^{[1
]}

Marks, LD ^{[1
]}

Ichihashi, T ^{[1
]}

Ajayan, PM ^{[1
]}

Iijima, S ^{[1
]}

机构：

[1] NEC CORP LTD,FUNDAMENTAL RES LABS,TSUKUBA,IBARAKI 305,JAPAN

来源：

PHYSICAL REVIEW LETTERS | 1996年 / 77卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.77.4226

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

High resolution electron microscope images of the Si(111)-(7 x 7) surface in the plan-view geometry have been analyzed, and the overlap of the top and bottom surfaces has been extracted numerically. The resultant images show clearly not just the adatoms seen by scanning tunneling microscopy but all the atoms in the top three layers, including the dimers in the third layer.

引用

页码：4226 / 4228

页数：3

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