Low energy ion assist during deposition - An effective tool for controlling thin film microstructure

被引:172
作者
Ensinger, W
机构
[1] University of Augsburg, Institute of Physics
关键词
D O I
10.1016/S0168-583X(97)00010-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Low-energy ion bombardment during growth of thin films from the vapour phase exerts a strong influence on the properties of the films, particularly their microstructure. The basic mechanisms of film growth under ion irradiation in the ion energy range below 1 keV are described on an atomic level. The dependence of the microstructure, such as grain size and orientation, and density of films on the process parameters ion-to-atom arrival ratio, angle of incidence, average deposited energy, and ion energy is discussed with recent results from the literature with silver as an example for a metal, germanium as a semiconductor and titanium nitride as a ceramic compound film.
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收藏
页码:796 / 808
页数:13
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