XPS and SEM studies of chromium oxide films chemically formed on stainless steel 316 L

被引：66

作者：

Stefanov, P

Stoychev, D

Stoycheva, M

Marinova, T ^{[1
]}

机构：

[1] Bulgarian Acad Sci, Inst Gen & Inorgan Chem, BU-1113 Sofia, Bulgaria

[2] Bulgarian Acad Sci, Inst Chem Phys, BU-1113 Sofia, Bulgaria

来源：

MATERIALS CHEMISTRY AND PHYSICS | 2000年 / 65卷 / 02期

关键词：

depth profiles; oxidation; stainless steel;

D O I：

10.1016/S0254-0584(00)00249-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The structure and composition of chromium oxide films formed on stainless steel by immersion in a chromium electrolyte have been studied by SEM and XPS. Cr2O3 crystallites in the range 30-150nm are fully developed and cover the whole surface. The chemical composition in the depth and the thickness of the oxide layer have been determined by XPS sputter profiles. The oxide film can be described within the framework of a double layer consisting of a thin outer hydrated layer and an inner layer of Cr2O3. (C) 2000 Elsevier Science S.A. All rights reserved.

引用

页码：212 / 215

页数：4

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