Experimental study of amplitude and phase detection limits in electron holography

被引:59
作者
Harscher, A [1 ]
Lichte, H [1 ]
机构
[1] TECH UNIV DRESDEN,INST ANGEW PHYS,D-01062 DRESDEN,GERMANY
关键词
D O I
10.1016/0304-3991(96)00019-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
The well-known advantages of electron holography are the availability of amplitude and phase of the electron wave and the resulting improvement of lateral resolution by correction of the coherent aberrations. The noise properties of the holographic method are very important: what are the smallest amplitude and phase differences detectable well above noise level in the reconstructed wave? Results of statistical evaluations collected from experimental holograms are compared with the existing theory.
引用
收藏
页码:57 / 66
页数:10
相关论文
共 13 条
[1]   DETECTION LIMITS IN QUANTITATIVE OFF-AXIS ELECTRON HOLOGRAPHY [J].
DERUIJTER, WJ ;
WEISS, JK .
ULTRAMICROSCOPY, 1993, 50 (03) :269-283
[2]  
DERUIJTER WJ, 1992, SCANNING MICROSCOPY, V6, P347
[3]  
DERUIJTER WJ, P 51 ANN MSA M CINC, P1062
[4]  
DERUIJTER WJ, 1994, MSA B, V24, P451
[5]   INTERPRETABLE RESOLUTION OF 0.2 NM AT 100 KV USING ELECTRON HOLOGRAPHY [J].
HARSCHER, A ;
LANG, G ;
LICHTE, H .
ULTRAMICROSCOPY, 1995, 58 (01) :79-86
[6]  
HARSCHER A, 1992, THESIS TUBINGEN
[7]  
LICHTE H, 1987, OPTIK, V77, P135
[8]   PARAMETERS FOR HIGH-RESOLUTION ELECTRON HOLOGRAPHY [J].
LICHTE, H .
ULTRAMICROSCOPY, 1993, 51 (1-4) :15-20
[9]   Artefacts in electron holography [J].
Lichte, H ;
Geiger, D ;
Harscher, A ;
Heindl, E ;
Lehmann, M ;
Malamidis, D ;
Orchowski, A ;
Rau, WD .
ULTRAMICROSCOPY, 1996, 64 (1-4) :67-77
[10]   ELECTRON HOLOGRAPHY SURMOUNTS RESOLUTION LIMIT OF ELECTRON-MICROSCOPY [J].
ORCHOWSKI, A ;
RAU, WD ;
LICHTE, H .
PHYSICAL REVIEW LETTERS, 1995, 74 (03) :399-402