A simple approach to compensate the suction caused by the electrospray ionization source in capillary electrophoresis-mass spectrometry systems
被引:8
作者:
do Lago, Claudimir Lucio
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机构:
Univ Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, BrazilUniv Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, Brazil
do Lago, Claudimir Lucio
[1
]
Rajh Vidal, Denis Tadeu
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Univ Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, BrazilUniv Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, Brazil
Rajh Vidal, Denis Tadeu
[1
]
Mendonca Francisco, Kelliton Jose
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Univ Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, BrazilUniv Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, Brazil
Mendonca Francisco, Kelliton Jose
[1
]
dos Santos, Vagner Bezerra
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Univ Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, BrazilUniv Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, Brazil
dos Santos, Vagner Bezerra
[1
]
机构:
[1] Univ Sao Paulo, Dept Quim Fundamental, Inst Quim, BR-05508000 Sao Paulo, Brazil
Backpressure;
Efficiency;
Electrospray;
Mass spectrometry;
ESI-MS;
FLOW;
INTERFACE;
INSIGHT;
PLASMA;
D O I:
10.1002/elps.201300651
中图分类号:
Q5 [生物化学];
学科分类号:
070307 [化学生物学];
摘要:
ESI sources continuously consume the liquid at the tip of the capillary, which causes the dragging of the BGE. The laminar nature of this flow causes the broadening of the peaks and loss of separation efficiency. The usual solution for this problem is to compensate this phenomenon by reducing the pressure at the inlet vial by either leveling of this vial or pumping off the air that is over it. However, one must know the pressure to be applied in order to prevent under-or over-compensation. The procedure herein introduced allows the easy calculation of this pressure by obtaining two electropherograms at two different values of separation voltage. The migration times of the peaks allow the calculation of the apparent mobilities even in the presence of the laminar flow. Therefore, one can calculate the contributions from both electrophoresis and hydrodynamic flow, and finally the pressure associated with the undesirable flow. This pressure is then applied as a negative pressure at the inlet vial in the following experiments. Increase of up to 192% in the number of plates was obtained in a simple experiment. In addition, the bubble forming caused by the ESI suction during injection was prevented by turning off the nebulizer gas during the changes of inlet vials.
机构:
ENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, FranceENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, France
Mokaddem, Meriem
;
Gareil, Pierre
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机构:
ENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, FranceENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, France
Gareil, Pierre
;
Belgaied, Jamel-Eddine
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机构:
Lab Chim Analyt & Electrochim, Tunis, TunisiaENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, France
Belgaied, Jamel-Eddine
;
Varenne, Anne
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机构:
ENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, FranceENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, France
机构:
ENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, FranceENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, France
Mokaddem, Meriem
;
Gareil, Pierre
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机构:
ENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, FranceENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, France
Gareil, Pierre
;
Belgaied, Jamel-Eddine
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h-index: 0
机构:
Lab Chim Analyt & Electrochim, Tunis, TunisiaENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, France
Belgaied, Jamel-Eddine
;
Varenne, Anne
论文数: 0引用数: 0
h-index: 0
机构:
ENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, FranceENSCP Paris 6, CNRS, UMR 7575, Lab Electrochim & Chim Analyt, F-75231 Paris 05, France