High pressure structural study of I-III-VI2 chalcopyrites

被引：25

作者：

Mori, Y ^{[1
]}

Takarabe, K ^{[1
]}

Iwamoto, S ^{[1
]}

Minomura, S ^{[1
]}

Niwa, E ^{[1
]}

Masumoto, K ^{[1
]}

机构：

[1] RES INST ELECT & MAGNET MAT,SENDAI,MIYAGI 982,JAPAN

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1996年 / 198卷 / 01期

关键词：

D O I：

10.1002/pssb.2221980155

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

High pressure powder X-ray diffraction studies are reported for the chalcopyrite phases of AgGaX(2), (X = S, Se, and Te). Structural parameters have been determined by the Rietveld method. While the cia ratio decreases with increasing pressure, the anion displacement parameter u is constant within experimental error for all samples investigated.

引用

页码：427 / 431

页数：5

共 10 条

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