Temperature and pressure dependences of the copper-related green emission in ZnO microrods

被引：19

作者：

Su, F. H.

Liu, Y. F.

Chen, W.

Wang, W. J.

Ding, K.

Li, G. H.

Joly, A. G.

McCready, D. E.

机构：

[1] Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China

[2] Nomad Inc, Stillwater, OK 74074 USA

[3] Pacific NW Natl Lab, Richland, WA 99354 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2006年 / 100卷 / 01期

基金：

美国国家卫生研究院; 中国国家自然科学基金;

关键词：

D O I：

10.1063/1.2206705

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have investigated the temperature and pressure dependences of the copper-related green emission, which show fine structure at low temperature, from tetrapodlike ZnO microrods. The temperature dependence of the green emission energy follows the changes in the band gap from 10-200 K, but deviates from this behavior above 200 K. The pressure dependence of the copper-related green band (25 +/- 5 meV/GPa) is similar to that of the band gap of ZnO, and is larger than that reported previously for defect-related green emission in ZnO. (c) 2006 American Institute of Physics.

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页数：6

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