High performance CMOS operation of strained-SOI MOSFETs using thin film SiGe-on-insulator substrate

被引:36
作者
Mizuno, T [1 ]
Sugiyama, N [1 ]
Tezuka, T [1 ]
Numata, T [1 ]
Takagi, S [1 ]
机构
[1] ASET, MIRAI Project, Saiwai Ku, Kawasaki, Kanagawa 212852, Japan
来源
2002 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS | 2002年
关键词
D O I
10.1109/VLSIT.2002.1015410
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:106 / 107
页数:2
相关论文
共 7 条
[1]  
MIZUNO, 1999, IEDM, P934
[2]   Advanced SOI-MOSFETs with strained-Si channel for high speed CMOS - Electron/hole mobility enhancement [J].
Mizuno, T ;
Sugiyama, N ;
Satake, H ;
Takagi, S .
2000 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2000, :210-211
[3]  
MIZUNO T, 2001, SSDM, P242
[4]   Subband structure and mobility of two-dimensional holes in strained Si/SiGe MOSFET's [J].
Oberhuber, R ;
Zandler, G ;
Vogl, P .
PHYSICAL REVIEW B, 1998, 58 (15) :9941-9948
[5]  
Rashed M, 1995, INTERNATIONAL ELECTRON DEVICES MEETING, 1995 - IEDM TECHNICAL DIGEST, P765, DOI 10.1109/IEDM.1995.499330
[6]   ON THE UNIVERSALITY OF INVERSION LAYER MOBILITY IN SI MOSFETS .1. EFFECTS OF SUBSTRATE IMPURITY CONCENTRATION [J].
TAKAGI, S ;
TORIUMI, A ;
IWASE, M ;
TANGO, H .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (12) :2357-2362
[7]  
TEZUKA T, 2000, SOLID STATE DEVICES, P472