Measuring average tip-sample forces in intermittent-contact (tapping) force microscopy in air

被引：18

作者：

Fain, SC ^{[1
]}

Barry, KA

Bush, MG

Pittenger, B

Louie, RN

机构：

[1] Univ Washington, Dept Phys, Seattle, WA 98195 USA

[2] Pacific Lutheran Univ, Dept Phys, Tacoma, WA 98447 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 07期

关键词：

D O I：

10.1063/1.125633

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A method to measure the average normal force on a surface produced by intermittent-contact (tapping) force microscopy is presented. This force is determined by measuring the average deflection of a calibrated piezoresistive cantilever in intermittent contact with an oscillating active cantilever. Results obtained with this method are presented for a two-state cantilever motion where the piezolever force is higher for the state with the lower amplitude of vibration. (C) 2000 American Institute of Physics. [S0003-6951(00)02007-6].

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收藏

页码：930 / 932

页数：3

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