Determination of the chemical width of grain boundaries of boron- and carbon-doped hot-pressed β-SiC by HAADF imaging and ELNES line-profile

被引:11
作者
Kaneko, K [1 ]
Kawasaki, M
Nagano, T
Tamari, N
Tsurekawa, S
机构
[1] JFCC, JST, ICORP, Cerami Superplast, Nagoya, Aichi 4568587, Japan
[2] JEOL Co Ltd, Akishima, Tokyo, Japan
[3] Osaka Natl Res Inst, Ikeda, Osaka 5638577, Japan
[4] Tohoku Univ, Grad Sch Engn, Dept Machine Intelligence & Syst Engn, Sendai, Miyagi 9808579, Japan
关键词
grain boundaries; transmission electron microscopy (TEM); electron energy loss spectroscopy (EELS); scanning/transmission electron microscopy (STEM); structural ceramics;
D O I
10.1016/S1359-6454(99)00393-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A residue of sintering additives is often found at the grain boundaries in sintered ceramics. This can be used to determine the macroscopic properties of the sintered polycrystalline materials. A combination of both high-angle annular dark-field (HAADF) imaging and energy-loss near edge-structure (ELNES) line-profile methods was carried out to measure the chemical width of grain boundaries using the sintering additives. Application of both HRTEM and HAADF imaging methods for boron- and carbon-doped hot-pressed SiC leads to the identification of the structural differences either within the matrix or at the grain boundaries very clearly. Additionally, EELS analysis was also carried out to identify the chemistries and bondings at the grain boundaries. The segregation of both boron and nitrogen is clearly shown, as well as the chemical width measured at the grain boundaries by the ELNES line-profile method. Incorporation of nitrogen within the grain interior was also detected by ELNES analysis. (C) 2000 Acta Metallurgica Inc. Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:903 / 910
页数:8
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