Ionization, electron attachment, and drift in CHF3

被引:26
作者
de Urquijo, J [1 ]
Alvarez, I [1 ]
Cisneros, C [1 ]
机构
[1] Univ Nacl Autonoma Mexico, Ctr Ciencias Fis, Cuernavaca 62251, Morelos, Mexico
关键词
D O I
10.1103/PhysRevE.60.4990
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Using a pulsed Townsend technique, we have measured the effective ionization coefficient and the electron drift velocities in CHF3. The density-normalized electric field intensity E/N ranged from 4 to 250 townsends (Td) (1 Td = 10(-17) V cm(2)). The E/N value at which the effective ionization coefficient becomes zero was estimated to be 66 Td. For E/N<20 Td, the electron attachment coefficients are practically constant, and are compatible to within about +/-70% with previously measured values at thecal energies and above. [S1063-651X(99)08410-X].
引用
收藏
页码:4990 / 4992
页数:3
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