Electronic transport and tip-loading force effect in self-assembled monolayer studied by conducting atomic force microscopy

被引：11

作者：

Song, Hyunwook ^{[1
]}

Lee, Changjin ^{[1
]}

Kang, Yongku ^{[1
]}

Lee, Takhee ^{[1
]}

机构：

[1] Gwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju 500712, South Korea

来源：

COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS | 2006年 / 284卷

关键词：

self-assembled monolayers; tunneling; conducting atomic force microscopy;

D O I：

10.1016/j.colsurfa.2005.11.052

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Charge transport is investigated for self-assembled monolayers (SAMs) with different molecular structures and various molecular lengths using conducting atomic force microscopy. Conduction mechanism for alkanethiol SAMs is investigated and electronic transport parameters such as barrier height phi(B) and tunneling decay coefficient are determined and compared with previously reported results. The effects of tip-loading force on metal-SAMs-metal junction properties for different molecular structures are investigated, indicating that molecules with rigid backbone are more resistive to applied loading force than molecules with flexible backbone. Therefore, different aspect of current-voltage characteristics is expected according to molecular structures under the influence of tip loads. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：583 / 588

页数：6

共 35 条

[1] Large on-off ratios and negative differential resistance in a molecular electronic device [J].