Probing the polarity of ferroelectric thin films with x-ray standing waves

被引：12

作者：

Bedzyk, MJ ^{[1
]}

Kazimirov, A

Marasco, DL

Lee, TL

Foster, CM

Bai, GR

Lyman, PF

Keane, DT

机构：

[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA

[2] Northwestern Univ, Mat Res Ctr, Evanston, IL 60208 USA

[3] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

[4] Adv Micro Devices, Austin, TX 78741 USA

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.61.R7873

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An x-ray-diffraction method that directly senses the phase of the structure factor is demonstrated and used for determining the local polarity of thin ferroelectric films. This method is based on the excitation of an x-ray standing-wave field inside the film as a result of the interference between-the strong incident x-ray wave and the weak kinematically Bragg-diffracted x-ray wave from the film. The method is used to sense the displacements of the Pb and Ti sublattices in single-crystal c-domain PbTiO3 thin films grown by metal-organic chemical-vapor deposition on SrTiO3(001) substrates.

引用

页码：R7873 / R7876

页数：4

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