Solder joint reliability of flip chip and plastic ball grid array assemblies under thermal, mechanical, and vibrational conditions

被引:79
作者
Lau, JH
机构
[1] Express Packaging Systems, Palo Alto
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING | 1996年 / 19卷 / 04期
关键词
solder joint reliability; ball grid array; flip chip;
D O I
10.1109/96.544363
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The thermal, mechanical, and vibrational responses of hip chip and plastic ball grid array (PBGA) solder joints have been determined in this study, The effects of overload environmental stress factors on the mechanical responses of the solder joints have been determined by bending and twisting experiments, The effects of shipping environmental stress factors on the vibrational responses of the solder joints have been determined by out-of-plane vibration experiments, Also, the thermal fatigue behavior of solder joints have been investigated by nonlinear finite element (FE), Coffin-Manson, and fracture mechanics methods.
引用
收藏
页码:728 / 735
页数:8
相关论文
共 18 条
[1]  
[Anonymous], 1995, BALL GRID ARRAY TECH
[2]  
FREAR D, 1991, MECH SOLDER ALLOY IN
[3]  
Kanninen MF., 1985, Advanced Fracture Mechanics
[4]  
Lau J., 1997, SOLDER JOINT RELIABI
[5]  
Lau J.H., 1994, CHIP BOARD TECHNOLOG
[6]  
Lau J.H., 1992, HDB TAPE AUTOMATED B
[7]  
Lau J.H., 1991, Solder Joint Reliability, Theory and Applications
[8]  
Lau J.H., 1996, FLIP CHIP TECHNOLOGI
[9]  
Lau J. H., 2021, Semiconductor Advanced Packaging, V239, DOI [10.1007/978-981-16-1376-0, DOI 10.1007/978-981-16-1376-0]
[10]   THERMAL FATIGUE LIFE PREDICTION OF FLIP-CHIP SOLDER JOINTS BY FRACTURE-MECHANICS METHOD [J].
LAU, JH .
ENGINEERING FRACTURE MECHANICS, 1993, 45 (05) :643-&