Polarity determination of GaN films by ion channeling and convergent beam electron diffraction

被引:174
作者
Daudin, B
Rouviere, JL
Arlery, M
机构
[1] CEA/Grenoble, Dept. Rech. Fond. sur Matiere C., 38054 Grenoble Cedex 9
关键词
D O I
10.1063/1.117504
中图分类号
O59 [应用物理学];
学科分类号
摘要
By using ion channeling and convergent beam electron diffraction techniques, we have determined the absolute polarity of various GaN films grown by MOCVD on (0001) sapphire. We observe two main classes of GaN films, namely flat and rough pyramidal ones. We find that flat GaN films have a Ga polarity. Rough pyramidal samples contain many tiny columnar inversion domains (with Ga polarity) imbedded in a matrix exhibiting an N polarity. (C) 1996 American Institute of Physics.
引用
收藏
页码:2480 / 2482
页数:3
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