Phase artefact reduction in magnetic resonance electrical impedance tomography (MREIT)

被引:6
作者
Lee, Byung Il [1 ]
Park, Chunjae
Pyo, Hyun Chan
Kwon, Ohin
Woo, Eung Je
机构
[1] Kyung Hee Univ, Coll Elect & Informat, Seoul, South Korea
[2] Konkuk Univ, Dept Math, Seoul, South Korea
关键词
D O I
10.1088/0031-9155/51/20/013
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
Cross-sectional conductivity imaging in magnetic resonance electrical impedance tomography (MREIT) requires the measurement of internal magnetic flux density using an MRI scanner. Current injection MRI techniques have been used to induce magnetic flux density distributions that appear in phase parts of the obtained MR signals. Since any phase error, as well as noise, deteriorates the quality of reconstructed conductivity images, we must minimize them during the data acquisition process. In this paper, we describe a new method to correct unavoidable phase errors to reduce artefacts in reconstructed conductivity images. From numerical simulations and phantom experiments, we found that the zeroth- and first-order phase errors can be effectively minimized to produce better conductivity images. The promising results suggest that this technique should be employed together with improved MREIT pulse sequences in future studies of high-resolution conductivity imaging.
引用
收藏
页码:5277 / 5288
页数:12
相关论文
共 31 条
[31]  
Zhang N, 1992, THESIS U TORONTO CAN