Terahertz behavior of optical components and common materials

被引:31
作者
Gatesman, Andrew J. [1 ]
Danylov, Andriy [1 ]
Goyette, Thomas M. [1 ]
Dickinson, Jason C. [1 ]
Giles, Robert H. [1 ]
Goodhue, William [1 ]
Waldman, Jerry [1 ]
Nixon, William E. [2 ]
Hoen, Weber [3 ]
机构
[1] Univ Massachusetts, Submillimeter Wave Technol Lab, Lowell, MA 01854 USA
[2] US Army, Natl Ground Intelligence Ctr, Charlottesville, VA 22911 USA
[3] MIT, Lincoln Lab, Aerospace Sensor Technol, Lexington, MA 02420 USA
来源
TERAHERTZ FOR MILITARY AND SECURITY APPLICATIONS IV | 2006年 / 6212卷
关键词
THz; materials; dielectric; absorbers; attenuation;
D O I
10.1117/12.668384
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
As short range, ground based, surveillance systems operating at terahertz frequencies continue to evolve, increasing attention is being directed towards the behavior of dielectric materials at terahertz frequencies as well as the behavior of optical components used to control terahertz radiation. This work provides an overview of several terahertz optical components such as frequency selective filters, laser output couplers, artificial dielectrics, and electromagnetic absorbers. In addition, a database was established that contains terahertz properties of common materials that have been largely unexplored in this region of the spectrum. The database consists of transmittance and reflectance spectra of a variety of materials measured using Fourier transform infrared spectroscopy techniques from 175 GHz - 2 THz. In addition, ultra-stable, CO2 optically pumped, far-infrared gas lasers were used to collect fixed-frequency transmittance data at 326 GHz, 584 GHz, and 1.04 THz. A Gunn oscillator was used for measurements at 94 GHz.
引用
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页数:12
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