Exchange biasing in polycrystalline thin film microstructures

被引：52

作者：

Yu, J

Kent, AD

Parkin, SSP

机构：

[1] NYU, Dept Phys, New York, NY 10003 USA

[2] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2000年 / 87卷 / 09期

关键词：

D O I：

10.1063/1.373244

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The effect of lateral element size, shape, and ferromagnetic layer thickness on exchange biasing in polycrystalline IrMn/CoFe thin film elements has been studied. Magnetic hysteresis loop measurements and magnetic force microscopy imaging have been used to elucidate the basic micromagnetic behavior. Magnetic imaging of micron scale elements illustrates that the magnetization reversal modes change significantly from those of unbiased ferromagnetic elements. (C) 2000 American Institute of Physics. [S0021- 8979(00)59108-7].

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页码：5049 / 5051

页数：3

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