Structure, hardness, and tribological properties of reactive magnetron sputtered chromium nitride films

被引:81
作者
He, XM
Baker, N
Kehler, BA
Walter, KC
Nastasi, M
Nakamura, Y
机构
[1] Univ Calif Los Alamos Natl Lab, MST 8, Los Alamos, NM 87545 USA
[2] Kagoshima Univ, Dept Engn Mech, Kagoshima 8900065, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 2000年 / 18卷 / 01期
关键词
D O I
10.1116/1.582154
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Chromium nitride (CrN) films with Cr/N atomic ratios of 0.73-1.46 were prepared by reactive dc-magnetron sputtering with Ar as the sputtering gas and N-2 as the reactive gas. The application of a negative bias voltage to the substrates and the decrement of the gas flow ratio of N-2 to Ar (or F-N2/F-Ar) promoted the growth of CrN films with preferred orientations of (200) + (220), high Cr/N ratios, and high densities. The functional hardness and compressive stress were highly dependent on the magnitude of the bias voltage and the Cr/N ratio that was adjusted by the F-N2/F-Ar ratio during film deposition. The optimal energy conditions for ion impingement on growing CrN films with compact columnar crystal structure, high hardness, and enhanced tribological propel-ties were studied with respect to the modulations of the bias voltages and the Cr/N ratios. The CrN films with high hardness and high wear resistance were synthesized in this study at low bias voltages of -(100-300) V and F-N2/F-Ar ratios of 1-3. (C) 2000 American Vacuum Society. [S0734-2101(00)02701-9].
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页码:30 / 36
页数:7
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