Oxygen isoelectronic impurity in ZnSxTe1-x

被引:29
作者
Seong, MJ [1 ]
Alawadhi, H
Miotkowski, I
Ramdas, AK
Miotkowska, S
机构
[1] Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
[2] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
关键词
D O I
10.1103/PhysRevB.60.R16275
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The binding energy of excitons bound to oxygen isoelectronic impurity in ZnSxTe1-x, shows a remarkable scaling with the difference between the electronegativity of oxygen and the concentration-weighted average of those of S and Te. The signatures of the free exciton, observed with wavelength modulated reflectivity, and those of shallow acceptor bound excitons, revealed in photoluminescence, show an unmistakable redshift with increasing x (0 less than or equal to x less than or equal to 0.13). In striking contrast, the excitons bound to the isoelectronic oxygen center in these alloys manifest a blueshift with increasing x. [S0163-1829(99)51148-X].
引用
收藏
页码:R16275 / R16278
页数:4
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