Correlations in the interface structure of Langmuir-Blodgett films observed by x-ray scattering

被引:44
作者
Nitz, V [1 ]
Tolan, M [1 ]
Schlomka, JP [1 ]
Seeck, OH [1 ]
Stettner, J [1 ]
Press, W [1 ]
Stelzle, M [1 ]
Sackmann, E [1 ]
机构
[1] TECH UNIV MUNICH,PHYS DEPT E22,D-85748 GARCHING,GERMANY
来源
PHYSICAL REVIEW B | 1996年 / 54卷 / 07期
关键词
D O I
10.1103/PhysRevB.54.5038
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
X-ray scattering experiments within the region of total external reflection as well as grazing-incidence-diffraction measurements from Langmuir-Blodgett films are shown. All measurements are explained quantitatively using the distorted-wave Born approximation (small q(z) regions) or a simple kinematic scattering theory (large q(z) regions) for layered systems. Since rather imperfect systems are investigated, strong vertical correlations between the roughnesses of the organic layer interfaces were found for two samples consisting of 9 and 11 layers, respectively, of cadmium-arachidate on silicon (100) surfaces. This conformal roughness does not stem from the substrate but from defects and holes of the first transferred layer. The model of self-affine rough interfaces yields consistent parameters compared with grazing incidence diffraction experiments and no hints towards a cadmium-arachidate island formation are observed.
引用
收藏
页码:5038 / 5050
页数:13
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