Deterministic simulation of first-order scattering in virtual X-ray imaging

被引:32
作者
Freud, N [1 ]
Duvauchelle, P [1 ]
Pistrui-Maximean, SA [1 ]
Létang, JM [1 ]
Babot, D [1 ]
机构
[1] Lyon Sci & Tech Univ, INSA, Lab Nondestruct Testing Ionizing Radiat, CNDRI, F-69621 Villeurbanne, France
关键词
X-ray imaging; Rayleigh and Compton scattering; computer simulation; ray tracing; Monte Carlo method; nondestructive testing;
D O I
10.1016/j.nimb.2004.01.001
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 [仪器科学与技术]; 080401 [精密仪器及机械]; 081102 [检测技术与自动化装置];
摘要
A deterministic algorithm is proposed to compute the contribution of first-order Compton- and Rayleigh-scattered radiation in X-ray imaging. This algorithm has been implemented in a simulation code named virtual X-ray imaging. The physical models chosen to account for photon scattering are the well-known form factor and incoherent scattering function approximations, which are recalled in this paper and whose limits of validity are briefly discussed. The proposed algorithm, based on a voxel discretization of the inspected object, is presented in detail, as well as its results in simple configurations, which are shown to converge when the sampling steps are chosen sufficiently small. Simple criteria for choosing correct sampling steps (voxel and pixel size) are established. The order of magnitude of the computation time necessary to simulate first-order scattering images amounts to hours with a PC architecture and can even be decreased down to minutes, if only a profile is computed (along a linear detector). Finally, the results obtained with the proposed algorithm are compared to the ones given by the Monte Carlo code Geant4 and found to be in excellent accordance, which constitutes a validation of our algorithm. The advantages and drawbacks of the proposed deterministic method versus the Monte Carlo method are briefly discussed. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:285 / 300
页数:16
相关论文
共 27 条
[1]
GEANT4-a simulation toolkit [J].
Agostinelli, S ;
Allison, J ;
Amako, K ;
Apostolakis, J ;
Araujo, H ;
Arce, P ;
Asai, M ;
Axen, D ;
Banerjee, S ;
Barrand, G ;
Behner, F ;
Bellagamba, L ;
Boudreau, J ;
Broglia, L ;
Brunengo, A ;
Burkhardt, H ;
Chauvie, S ;
Chuma, J ;
Chytracek, R ;
Cooperman, G ;
Cosmo, G ;
Degtyarenko, P ;
Dell'Acqua, A ;
Depaola, G ;
Dietrich, D ;
Enami, R ;
Feliciello, A ;
Ferguson, C ;
Fesefeldt, H ;
Folger, G ;
Foppiano, F ;
Forti, A ;
Garelli, S ;
Giani, S ;
Giannitrapani, R ;
Gibin, D ;
Cadenas, JJG ;
González, I ;
Abril, GG ;
Greeniaus, G ;
Greiner, W ;
Grichine, V ;
Grossheim, A ;
Guatelli, S ;
Gumplinger, P ;
Hamatsu, R ;
Hashimoto, K ;
Hasui, H ;
Heikkinen, A ;
Howard, A .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2003, 506 (03) :250-303
[2]
Present status of Geant4 [J].
Amako, K .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 453 (1-2) :455-460
[3]
The measurement of the wall thickness of steel sections using Compton backscattering [J].
Asad, Z ;
Asghar, M ;
Imrie, DC .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1997, 8 (04) :377-385
[4]
ON THE COMPTON DEFECT [J].
BELL, F .
JOURNAL OF CHEMICAL PHYSICS, 1986, 85 (01) :303-307
[5]
An overview of the theories used in Compton scattering calculations [J].
Bergstrom, PM ;
Pratt, RH .
RADIATION PHYSICS AND CHEMISTRY, 1997, 50 (01) :3-29
[6]
Fast sampling algorithm for the simulation of photon Compton scattering [J].
Brusa, D ;
Stutz, G ;
Riveros, JA ;
FernandezVarea, JM ;
Salvat, F .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 379 (01) :167-175
[7]
90° Compton and Rayleigh measurements and imaging [J].
Cesareo, R ;
Balogun, F ;
Brunetti, A ;
Borlino, CC .
RADIATION PHYSICS AND CHEMISTRY, 2001, 61 (3-6) :339-342
[9]
CULLEN DE, 1997, UCRLID50400 LAWR LIV, V6
[10]
A computer code to simulate X-ray imaging techniques [J].
Duvauchelle, P ;
Freud, N ;
Kaftandjian, V ;
Babot, D .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 170 (1-2) :245-258