Electrothermal effects at the microscale and their consequences on system design

被引：21

作者：

Jungen, Alain ^{[1
]}

Pfenninger, Marc ^{[1
]}

Tonteling, Marc ^{[1
]}

Stampfer, Christoph ^{[1
]}

Hierold, Christofer ^{[1
]}

机构：

[1] Swiss Fed Inst Technol, CH-8092 Zurich, Switzerland

来源：

JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 2006年 / 16卷 / 08期

关键词：

Thermoelectricity;

D O I：

10.1088/0960-1317/16/8/027

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electrothermal devices exhibit increasing secondary effects upon downscaling. These effects alter their temperature profiles and thermal energy distributions. Based on scaling laws, we show that the Thomson effect is increased over Joule heating as the structures are sized down. Thermal models are upgraded to take into account this secondary effect, and finite element simulations together with experimental runs validate them.

引用

页码：1633 / 1638

页数：6