Two-color two-photon 4Pi fluorescence microscopy

被引：20

作者：

Chen, JF

Midorikawa, K

机构：

[1] RIKEN, Laser Technol Lab, Wako, Saitama 3510198, Japan

[2] Saitama Univ, Saitama City, Saitama 3388570, Japan

来源：

OPTICS LETTERS | 2004年 / 29卷 / 12期

关键词：

D O I：

10.1364/OL.29.001354

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In 4Pi fluorescence microscopy the point-spread function is composed of a strong central lobe accompanied by interference sidelobes that produce artifacts in the image. We propose to combine two-color two-photon fluorescence microscopy and 4Pi fluorescence microscopy to overcome this sidelobe problem. Simulation results show that a single sharp fluorescence spot can be produced by use of two excitation wavelengths of 400 and 800 nm and detected at 350-nm emission wavelength. (C) 2004 Optical Society of America.

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页码：1354 / 1356

页数：3

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