Dynamic AFM using the FM technique with constant excitation amplitude

被引:19
作者
Gotsmann, B [1 ]
Fuchs, H [1 ]
机构
[1] Univ Munster, Inst Phys, D-48149 Munster, Germany
关键词
AFM; frequency modulation; constant excitation; dynamic force spectroscopy;
D O I
10.1016/S0169-4332(01)00950-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Dynamic atomic force microscopy using the frequency modulation technique is investigated for the case that the excitation amplitude is kept constant. This mode of operation has very unique properties. A computer simulation is used to investigate the distance dependence of the measurement signals frequency and amplitude using various conservative and non-conservative interaction forces. It is shown how the two measurement channels are interlinked and influenced by both conservative and dissipative interactions. Further, discontinuous frequency shift versus distance curves as reported in the literature were not obtained. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:355 / 362
页数:8
相关论文
共 29 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   How to measure energy dissipation in dynamic mode atomic force microscopy [J].
Anczykowski, B ;
Gotsmann, B ;
Fuchs, H ;
Cleveland, JP ;
Elings, VB .
APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :376-382
[3]  
ANCZYKOWSKI B, 1996, PHYS REV B, V53, P485
[4]   Bias dependence of Si(111) 7 X 7 images observed by noncontact atomic force microscopy [J].
Arai, T ;
Tomitori, M .
APPLIED SURFACE SCIENCE, 2000, 157 (04) :207-211
[5]   Energy dissipation in tapping-mode atomic force microscopy [J].
Cleveland, JP ;
Anczykowski, B ;
Schmid, AE ;
Elings, VB .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615
[6]   Measuring viscous dissipative interactions in dynamic force microscopy [J].
Duerig, U. .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 72 (Suppl 1) :S43-S46
[7]   Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy [J].
Dürig, U .
APPLIED PHYSICS LETTERS, 1999, 75 (03) :433-435
[8]   Forces and frequency shifts in atomic-resolution dynamic-force microscopy [J].
Giessibl, FJ .
PHYSICAL REVIEW B, 1997, 56 (24) :16010-16015
[9]   ATOMIC-RESOLUTION OF THE SILICON (111)-(7X7) SURFACE BY ATOMIC-FORCE MICROSCOPY [J].
GIESSIBL, FJ .
SCIENCE, 1995, 267 (5194) :68-71
[10]   Conservative and dissipative tip-sample interaction forces probed with dynamic AFM [J].
Gotsmann, B ;
Seidel, C ;
Anczykowski, B ;
Fuchs, H .
PHYSICAL REVIEW B, 1999, 60 (15) :11051-11061