Edge transfer lithography using alkanethiol inks

被引:36
作者
Sharpe, Ruben B. A.
Titulaer, Bram J. F.
Peeters, Emiel
Burdinski, Dirk
Huskens, Jurriaan
Zandvliet, Harold J. W.
Reinhoudt, David N.
Poelsema, Bene
机构
[1] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
[2] Philips Res, NL-5656 AE Eindhoven, Netherlands
关键词
D O I
10.1021/nl0607885
中图分类号
O6 [化学];
学科分类号
0703 [化学];
摘要
Edge lithographic patterning techniques are based on the utilization of the edges of micrometer-sized template features for the reproduction of submicrometer structures. Edge transfer lithography (ETL) permits local surface modification in a single step by depositing self-assembled monolayers onto a metal substrate selectively along the feature edges of an elastomeric stamp. In this report two stamp designs are described that now allow for the use of alkanethiol inks in ETL and their use as etch resists to reproduce submicrometer structures in gold. Anisotropically modified stamps are shown to combine the potential for very high-resolution patterning with the versatility and simplicity of microcontact printing.
引用
收藏
页码:1235 / 1239
页数:5
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