Atmospheric pressure fabrication of SnO2-nanowires for highly sensitive CO and CH4 detection

被引:84
作者
Koeck, Anton [1 ]
Tischner, Alexandra [1 ]
Maier, Thomas [1 ]
Kast, Michael [1 ]
Edtmaier, Christian [2 ]
Gspan, Christian [3 ,4 ]
Kothleitner, Gerald [3 ,4 ]
机构
[1] Austrian Res Ctr GmbH ARC, Div Nanosyst Technol, A-1220 Vienna, Austria
[2] Vienna Univ Technol, Inst Chem Technol & Analyt, A-1040 Vienna, Austria
[3] Graz Univ Technol, Inst Elect Microscopy & Fine Struct Res, A-8010 Graz, Austria
[4] Ctr Electron Microscopy Graz, A-8010 Graz, Austria
关键词
Nanowires; Nanosensors; Gas sensors; Spray pyrolysis; Tin dioxide; TIN OXIDE NANOWIRE; GAS SENSORS; CARBON-MONOXIDE; SNO2; NANOWIRES; METAL-OXIDES; SEMICONDUCTOR NANOWIRES; OPTICAL-PROPERTIES; CHEMICAL SENSORS; HUMIDITY; TEMPERATURE;
D O I
10.1016/j.snb.2009.02.055
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
In this paper we report on a new approach for the fabrication of ultra-long single crystalline SnO2-nanowires for gas sensing applications based on a combined spray pyrolysis and annealing process. The SnO2-nanowires are grown on SiO2-coated Si-substrates and exhibit diameters of 30-400nm and lengths up to several 100 mu m. The whole SnO2-nanowire fabrication procedure is performed at atmospheric pressure and requires no vacuum. The experimental results suggest a competing evaporation and condensation process, which converts the nanocrystalline SnO2-films into single crystalline SnO(2-)nanowires directly on the chip. For the realization of gas sensors the SnO2-nanowires are transferred to-another SiO2-coated Si-substrate. Evaporation of Ti/Au contact pads on both ends of single SnO2-nanowires enables their direct use as sensing elements. The devices are very sensitive, are able to detect humidity, and concentrations of CO and CH4 as low as a few ppm at operating temperatures of 200-250 degrees C. We believe that our fabrication procedure might be the technology of choice for the controlled fabrication of SnO2-nanowires as highly sensitive gas sensing elements on a wafer scale. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:160 / 167
页数:8
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