共 53 条
Atmospheric pressure fabrication of SnO2-nanowires for highly sensitive CO and CH4 detection
被引:84
作者:
Koeck, Anton
[1
]
Tischner, Alexandra
[1
]
Maier, Thomas
[1
]
Kast, Michael
[1
]
Edtmaier, Christian
[2
]
Gspan, Christian
[3
,4
]
Kothleitner, Gerald
[3
,4
]
机构:
[1] Austrian Res Ctr GmbH ARC, Div Nanosyst Technol, A-1220 Vienna, Austria
[2] Vienna Univ Technol, Inst Chem Technol & Analyt, A-1040 Vienna, Austria
[3] Graz Univ Technol, Inst Elect Microscopy & Fine Struct Res, A-8010 Graz, Austria
[4] Ctr Electron Microscopy Graz, A-8010 Graz, Austria
关键词:
Nanowires;
Nanosensors;
Gas sensors;
Spray pyrolysis;
Tin dioxide;
TIN OXIDE NANOWIRE;
GAS SENSORS;
CARBON-MONOXIDE;
SNO2;
NANOWIRES;
METAL-OXIDES;
SEMICONDUCTOR NANOWIRES;
OPTICAL-PROPERTIES;
CHEMICAL SENSORS;
HUMIDITY;
TEMPERATURE;
D O I:
10.1016/j.snb.2009.02.055
中图分类号:
O65 [分析化学];
学科分类号:
070302 ;
081704 ;
摘要:
In this paper we report on a new approach for the fabrication of ultra-long single crystalline SnO2-nanowires for gas sensing applications based on a combined spray pyrolysis and annealing process. The SnO2-nanowires are grown on SiO2-coated Si-substrates and exhibit diameters of 30-400nm and lengths up to several 100 mu m. The whole SnO2-nanowire fabrication procedure is performed at atmospheric pressure and requires no vacuum. The experimental results suggest a competing evaporation and condensation process, which converts the nanocrystalline SnO2-films into single crystalline SnO(2-)nanowires directly on the chip. For the realization of gas sensors the SnO2-nanowires are transferred to-another SiO2-coated Si-substrate. Evaporation of Ti/Au contact pads on both ends of single SnO2-nanowires enables their direct use as sensing elements. The devices are very sensitive, are able to detect humidity, and concentrations of CO and CH4 as low as a few ppm at operating temperatures of 200-250 degrees C. We believe that our fabrication procedure might be the technology of choice for the controlled fabrication of SnO2-nanowires as highly sensitive gas sensing elements on a wafer scale. (C) 2009 Elsevier B.V. All rights reserved.
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页码:160 / 167
页数:8
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