Electrical conduction of conjugated molecular SAMs studied by conductive atomic force microscopy

The electrical conduction of self-assembled monolayers (SAMs) made from conjugated molecules was measured using conductive atomic force microscopy (AFM), with a focus on the molecular structural effect on the electrical conduction. For phenylene oligomer SAMs, resistances through the monolayers increased exponentially with increases in molecular length and the decay constants of transconductance beta were ca. 0.35 to 0.5 Angstrom(-1). Using an insertion technique into insulative alkanethiol SAMs, we successfully obtained single molecular resistance of terphenyl methanethiol at ca. 5.4 x 10(10) Omega. We further investigated the influence of applied load on the resistances. The resistances through terphenyl SAMs increased with increases in the applied load up to 15 nN. When two or three methylene spacers were introduced between the sulfur and terphenyl groups in a series of terphenyl derivatized thiols, the monolayer resistances and,8 values increased extraordinarily. One explanation is that the addition of methylene spacers changed the location of the molecular orbital as a result of MOPAC calculation.