Properties of strained (In, Ga, Al)As lasers with laterally modulated active region

被引:25
作者
Ledentsov, NN
Bimberg, D
Shernyakov, YM
Kochnev, V
Maximov, MV
Sakharov, AV
Krestnikov, IL
Egorov, AY
Zhukov, AE
Tsatsulnikov, AF
Volovik, BV
Ustinov, VM
Kopev, PS
Alferov, ZI
Kosogov, AO
Werner, P
机构
[1] AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA
[2] MAX PLANCK INST MIKROSTRUKTURPHYS,D-06120 HALLE,GERMANY
关键词
D O I
10.1063/1.119032
中图分类号
O59 [应用物理学];
学科分类号
摘要
Transmission electron microscopy studies of low indium composition InxGa1-xAs insertions (x<0.4) in a GaAs matrix deposited by molecular beam epitaxy or by metal-organic chemical vapor deposition reveal nanoscale quasiperiodic compositional and morphological modulations. The luminescence peak wavelength is found to be a strong function of deposition parameters and can be tuned from 1.1 to 1.3 mu m for the same x and average thickness of the deposit. Strained (In, Ga Al)As lasers with such a laterally modulated InxGa1-xAs active region demonstrate significant depolarization of the electroluminescence. For short cavity length, lasing occurs at energies corresponding to transitions between InxGa1-xAs conduction band and light holelike valence band states. Devices lase at low threshold current densities and demonstrate continuous wave operation up to 3 W at room temperature. (C) 1997 American Institute of Physics.
引用
收藏
页码:2888 / 2890
页数:3
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