An improved mode of operation of a transmission electron microscope for wide field off-axis holography

被引：10

作者：

Frost, BG ^{[1
]}

Voelkl, E ^{[1
]}

Allard, LF ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,OAK RIDGE,TN 37831

来源：

ULTRAMICROSCOPY | 1996年 / 63卷 / 01期

关键词：

D O I：

10.1016/0304-3991(96)00046-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

An improved mode of operation for low magnification off-axis electron holography is presented which permits a significant increase of the field of view over that obtained by the standard low magnification technique in a standard field emission transmission electron microscope. This improvement is achieved by a weak excitation of the objective lens. Ray diagrams for the different low magnification modes are discussed and verified on a Hitachi HF-2000 transmission electron microscope operated in free lens control mode.

引用

页码：15 / 20

页数：6

共 17 条

[1] INTERFERENZMIKROSKOPIE MIT ELEKTRONENWELLEN [J].