OBSERVATION OF ELECTROSTATIC FIELDS BY ELECTRON HOLOGRAPHY - THE CASE OF REVERSE-BIASED P-N-JUNCTIONS

被引：74

作者：

FRABBONI, S

MATTEUCCI, G

POZZI, G

机构：

[1] UNIV BOLOGNA,CTR ELECTRON MICROSCOPY,CISM,I-40126 BOLOGNA,ITALY

[2] UNIV BOLOGNA,GRP NAZL STRUTTURA MAT,CNR,DEPT PHYS,I-40126 BOLOGNA,ITALY

来源：

ULTRAMICROSCOPY | 1987年 / 23卷 / 01期

关键词：

This work has been supported by funds from the Ministero della Pubblica Istruzione; Italia;

D O I：

10.1016/0304-3991(87)90224-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：29 / 37

页数：9

共 17 条

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[8] INTERFERENCE ELECTRON-MICROSCOPY IN THIN-FILM INVESTIGATIONS [J].

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[9]

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[10]

MERLI PG, 1978, OPTIK, V51, P39

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