ELECTRON HOLOGRAPHIC OBSERVATIONS OF THE ELECTROSTATIC-FIELD ASSOCIATED WITH THIN REVERSE-BIASED P-N-JUNCTIONS

被引：138

作者：

FRABBONI, S

MATTEUCCI, G

POZZI, G

VANZI, M

机构：

[1] UNIV BOLOGNA,CTR ITALIANO STRUTTURA MAT,GRP NAZL STRUTTURA MAT,I-40126 BOLOGNA,ITALY

[2] TELETTRA SPA,DEPT RELIABIL & QUAL,I-20059 VIMERCATE,ITALY

来源：

关键词：

D O I：

10.1103/PhysRevLett.55.2196

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：2196 / 2199

页数：4

共 13 条

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