TRANSMISSION ELECTRON-MICROSCOPY OBSERVATIONS OF P-N-JUNCTIONS

[1] LOW-ANGLE ELECTRON-DIFFRACTION WITH ELMISKOP 101 ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (01): : 35 - 39

[2] FUJITA H, 1974, HIGH VOLTAGE ELECTRO, P426

[3] GROVE AS, 1962, PHYSICS TECHNOLOGY S

[4] LINDBURY DPG, 1970, S ION BEAM THINNING

[5] ELECTRON INTERFEROMETRY WITH ELMISKOP 101 ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (09): : 729 - 732

[6] CONTRAST EFFECTS IN OUT-OF-FOCUS IMAGES OF A P-N-JUNCTION [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1973, 20 (02): : K87 - +

[7] MERLI PG, 1974, J SUBMICR CYTOL PATH, V6, P138

[8] OBSERVATION OF P-N-JUNCTION IN TRANSMISSION ELECTRON-MICROSCOPY BY OUT-OF-FOCUS TECHNIQUE [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1973, 16 (02): : K89 - K91

[9] MERLI PG, 1974, J MICROSC-OXFORD, V21, P11

[10] MERLI PG, 1974, 8 INT C EL MICR CANB, P642

[1] LOW-ANGLE ELECTRON-DIFFRACTION WITH ELMISKOP 101 ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (01): : 35 - 39

[2] FUJITA H, 1974, HIGH VOLTAGE ELECTRO, P426

[3] GROVE AS, 1962, PHYSICS TECHNOLOGY S

[4] LINDBURY DPG, 1970, S ION BEAM THINNING

[5] ELECTRON INTERFEROMETRY WITH ELMISKOP 101 ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (09): : 729 - 732

[6] CONTRAST EFFECTS IN OUT-OF-FOCUS IMAGES OF A P-N-JUNCTION [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1973, 20 (02): : K87 - +

[7] MERLI PG, 1974, J SUBMICR CYTOL PATH, V6, P138

[8] OBSERVATION OF P-N-JUNCTION IN TRANSMISSION ELECTRON-MICROSCOPY BY OUT-OF-FOCUS TECHNIQUE [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1973, 16 (02): : K89 - K91

[9] MERLI PG, 1974, J MICROSC-OXFORD, V21, P11

[10] MERLI PG, 1974, 8 INT C EL MICR CANB, P642