CONTRAST EFFECTS IN OUT-OF-FOCUS IMAGES OF A P-N-JUNCTION

[1] LOW-ANGLE ELECTRON-DIFFRACTION WITH ELMISKOP 101 ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (01): : 35 - 39

[2] Komrska J., 1971, ADV ELECTRONICS ELEC, V30, P139

[3] OBSERVATION OF P-N-JUNCTION IN TRANSMISSION ELECTRON-MICROSCOPY BY OUT-OF-FOCUS TECHNIQUE [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1973, 16 (02): : K89 - K91

[4] A NEW METHOD FOR INVESTIGATING ELECTRIC FIELD REGIONS OF P-N JUNCTIONS [J]. PHYSICA STATUS SOLIDI, 1969, 34 (02): : K83 - +

[5] WADE RH, 1973, ADV OPTICAL ELECTRON

[1] LOW-ANGLE ELECTRON-DIFFRACTION WITH ELMISKOP 101 ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (01): : 35 - 39

[2] Komrska J., 1971, ADV ELECTRONICS ELEC, V30, P139

[3] OBSERVATION OF P-N-JUNCTION IN TRANSMISSION ELECTRON-MICROSCOPY BY OUT-OF-FOCUS TECHNIQUE [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1973, 16 (02): : K89 - K91

[4] A NEW METHOD FOR INVESTIGATING ELECTRIC FIELD REGIONS OF P-N JUNCTIONS [J]. PHYSICA STATUS SOLIDI, 1969, 34 (02): : K83 - +

[5] WADE RH, 1973, ADV OPTICAL ELECTRON