In situ electron-beam processing for GaAs/AlGaAs nanostructure fabrications

被引:12
作者
Ishikawa, T
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1996年 / 35卷 / 11期
关键词
nanostructure; in situ process; UHV; EB lithography; Cl-2-gas etching; GaAs; MBE; GaAs oxide; buried structure; quantum wire; self-organized epitaxy; EB-induced damage; nonradiative recombination;
D O I
10.1143/JJAP.35.5583
中图分类号
O59 [应用物理学];
学科分类号
摘要
The requirements for the fabrication technology of 2-dimensional and/or 3-dimensional nanometer-scale heterostructures with III-V compound semiconductors are described. In addition to a fabrication capability with nanometer accuracy, the processes must avoid both undesirable contaminations and any damage effect. To meet these requirements, we have developed in situ electron-beam (EB) processing in which all of the processes, including EB lithography, pattern etching and epitaxial overgrowth, are performed successively in an ultra-high vacuum-based environment. The present status of this technique, i.e. nanometer-scale patterning, cleanliness of the processed surfaces and damage-free characteristics, is discussed. It is also demonstrated that self-organized epitaxy, which is now being intensively studied, can be combined with in situ EB processing as an elemental process.
引用
收藏
页码:5583 / 5596
页数:14
相关论文
共 42 条
[1]  
AKITA K, 1990, P SOC PHOTO-OPT INS, V1392, P576
[2]  
BISHOP H, 1968, BR J APPL PHYS SER, P673
[3]   ELECTRON-BEAM-INDUCED DAMAGE STUDY IN GAAS-ALGAAS HETEROSTRUCTURES AS DETERMINED BY MAGNETOTRANSPORT CHARACTERIZATION [J].
FINK, T ;
SMITH, DD ;
BRADDOCK, WD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1990, 37 (06) :1422-1425
[4]   CHEMICAL DRY ETCHING OF GAAS AND INP BY CL2 USING A NEW ULTRAHIGH-VACUUM DRY-ETCHING MOLECULAR-BEAM-EPITAXY SYSTEM [J].
FURUHATA, N ;
MIYAMOTO, H ;
OKAMOTO, A ;
OHATA, K .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :168-171
[5]   REDUCTION IN SIDEWALL RECOMBINATION VELOCITY BY SELECTIVE DISORDERING IN GAAS/ALGAAS QUANTUM-WELL MESA STRUCTURES [J].
HAMAO, N ;
SUGIMOTO, M ;
KOHMOTO, S ;
YOKOYAMA, H .
APPLIED PHYSICS LETTERS, 1991, 59 (12) :1488-1490
[6]   EFFECTS OF ELECTRON-BEAM IRRADIATION AND SUBSEQUENT CL2 EXPOSURE ON PHOTOOXIDIZED C(4 X 4) GAAS - MECHANISM OF IN-SITU EB LITHOGRAPHIC PATTERNING [J].
IDE, Y ;
YAMADA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (10A) :L1378-L1381
[7]   CHLORINE ADSORPTION ON ELECTRON-BEAM IRRADIATED GAAS PHOTO-OXIDES - MECHANISM OF IN-SITU EB LITHOGRAPHY [J].
IDE, Y ;
YAMADA, M .
APPLIED SURFACE SCIENCE, 1994, 82-3 :310-315
[8]   SAMPLE-SIZE DEPENDENCE OF MAGNETOCONDUCTANCE FLUCTUATIONS IN NARROW N+-GAAS WIRES [J].
ISHIBASHI, K ;
KAWAI, H ;
GAMO, K ;
NAMBA, S ;
ISHIDA, S ;
MURASE, K ;
AOYAGI, Y ;
KAWABE, M .
SOLID STATE COMMUNICATIONS, 1987, 63 (12) :1169-1171
[9]   IN-SITU FABRICATION OF BURIED GAAS/ALGAAS QUANTUM-WELL MESA-STRIPE STRUCTURES WITH IMPROVED REGROWN INTERFACES [J].
ISHIKAWA, T ;
MATSUYAMA, I ;
TANAKA, N ;
LOPEZ, M ;
TAMURA, M ;
NANBU, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1995, 34 (10B) :L1412-L1415
[10]   Nanometer-scale pattern formation of GaAs by in situ electron-beam lithography using surface oxide layer as a resist film [J].
Ishikawa, T ;
Tanaka, N ;
Lopez, M ;
Matsuyama, I .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06) :2777-2780