Nanoindentation of silicon surfaces: Molecular-dynamics simulations of atomic force microscopy

被引:35
作者
Astala, R
Kaukonen, M
Nieminen, RM
Heine, T
机构
[1] Aalto Univ, Phys Lab, FIN-02015 Helsinki, Finland
[2] Sch Chem, Exeter EX4 4QD, Devon, England
关键词
D O I
10.1103/PhysRevB.61.2973
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigate the atomic-scale details of atomic force microscopy through a quasistatic molecular dynamics simulation together with a density-functional-based tight-binding method. The changes in the AFM tip shape, the size of the tip-sample contact area, as well as the microscopic hardness and Young's moduli of silicon {111},{110},{100} surfaces are studied. Furthermore, the effects of hydrogen termination of the surface and of subsurface vacancies on hardness and Young's modulus are discussed.
引用
收藏
页码:2973 / 2980
页数:8
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