Contact, nanoindentation, and sliding friction

被引:71
作者
Buldum, A [1 ]
Ciraci, S
Batra, IP
机构
[1] Bilkent Univ, Dept Phys, TR-06533 Ankara, Turkey
[2] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
来源
PHYSICAL REVIEW B | 1998年 / 57卷 / 04期
关键词
D O I
10.1103/PhysRevB.57.2468
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents an atomic-scale study of contact, indentation, and subsequent pulling and dry sliding of a sharp and blunt metal tip on a metal surface. The evolution of atomic structure and the variation of perpendicular and lateral forces are calculated by molecular-dynamics methods using an empirical potential based on the embedded-atom model. The sharp tip experiences multiple jumps to contact in the attractive force range. The contact interface grows discontinuously mainly due to disorder-order transformation leading to disappearance of a layer and hence abrupt changes in the normal-force variation. Atom exchange occurs in the repulsive range. During the pulling off, the connective neck is reduced discontinuously; however, not all the abrupt changes of the pulling force are associated with the creation of a new layer in the neck. The sliding of the sharp tip (or single asperity) induces two consecutive structural transformations that occur periodically, but end with the wear of a layer. The situation for a blunt tip is, however, quite different.
引用
收藏
页码:2468 / 2476
页数:9
相关论文
共 48 条
[1]   EFFECT OF TIP PROFILE ON ATOMIC-FORCE MICROSCOPE IMAGES - A MODEL STUDY [J].
ABRAHAM, FF ;
BATRA, IP ;
CIRACI, S .
PHYSICAL REVIEW LETTERS, 1988, 60 (13) :1314-1317
[2]   PLASTIC-DEFORMATION OF NANOMETER-SCALE GOLD CONNECTIVE NECKS [J].
AGRAIT, N ;
RUBIO, G ;
VIEIRA, S .
PHYSICAL REVIEW LETTERS, 1995, 74 (20) :3995-3998
[3]   CONDUCTANCE STEPS AND QUANTIZATION IN ATOMIC-SIZE CONTACTS [J].
AGRAIT, N ;
RODRIGO, JG ;
VIEIRA, S .
PHYSICAL REVIEW B, 1993, 47 (18) :12345-12348
[4]  
BAYRA IP, 1986, PHYS REV B, V34, P8246
[5]  
BHUSHAN B, 1997, MICRONANOTRIBOLOGY I
[6]   QUANTIZED CONDUCTANCE IN ATOM-SIZED WIRES BETWEEN 2 METALS [J].
BRANDBYGE, M ;
SCHIOTZ, J ;
SORENSEN, MR ;
STOLTZE, P ;
JACOBSEN, KW ;
NORSKOV, JK ;
OLESEN, L ;
LAEGSGAARD, E ;
STENSGAARD, I ;
BESENBACHER, F .
PHYSICAL REVIEW B, 1995, 52 (11) :8499-8514
[7]   CONDITIONS FOR CONDUCTANCE QUANTIZATION IN REALISTIC MODELS OF ATOMIC-SCALE METALLIC CONTACTS [J].
BRATKOVSKY, AM ;
SUTTON, AP ;
TODOROV, TN .
PHYSICAL REVIEW B, 1995, 52 (07) :5036-5051
[8]   Atomic-scale study of dry sliding friction [J].
Buldum, A ;
Ciraci, S .
PHYSICAL REVIEW B, 1997, 55 (04) :2606-2611
[9]  
BULDUM A, 1977, PHYS REV B, V55, P12892
[10]   SITE-DEPENDENT ELECTRONIC EFFECTS, FORCES, AND DEFORMATIONS IN SCANNING TUNNELING MICROSCOPY OF FLAT METAL-SURFACES [J].
CIRACI, S ;
BARATOFF, A ;
BATRA, IP .
PHYSICAL REVIEW B, 1990, 42 (12) :7618-7621