Interdiffusion in Co/C soft X-ray multilayer mirrors

被引:7
作者
Bai, HL
Jing, EY
Wang, CD
机构
[1] Department of Applied Physics, Tianjin University
基金
中国国家自然科学基金;
关键词
diffusion; heat treatment; multilayers; X-ray diffraction;
D O I
10.1016/S0040-6090(96)08540-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The interdiffusion behaviours in the amorphous Co/C multilayers prepared by dual-facing-target sputtering techniques are investigated quantitatively by monitoring the enhancement of the first-order modulation peak on annealing in the temperature range of similar to 473-523 K. Effective interdiffusion coefficients as low as 10(-25) m(2) s(-1) were measured. The negative true macroscopic interdiffusion coefficients were obtained by measuring the effective interdiffusion coefficient as a function of modulation wavelength, indicating that then is a tendency to phase separation in the Co-C system. This result is also predicted by the positive enthalpy of mixing, calculated based on Miedema's macroscopic atom model. The temperature dependence of the true macroscopic interdiffusion coefficients can be described as D = - 1.66 x 10(10) exp[-(128 +/- 10) KJ mol(-1)/RT] m(2) s(-1). The existence of a critical wavelength below which the effective interdiffusion coefficicnt changes its sign is proposed, and it was calculated to be similar to 19.8-20.5 Angstrom at temperatures ranging from 473 K to 523 K. The spread values of the critical wavelength are believed to be attributed to the composition dependence of the gradient energy coefficient k and the second derivative of the Helmholtz energy f(0)(n).
引用
收藏
页码:176 / 183
页数:8
相关论文
共 66 条
[1]  
Agarwal B. K., 1979, XRAY SPECTROSCOPY, P134
[2]   MOLYBDENUM-SILICON MULTILAYER MIRRORS FOR THE EXTREME ULTRAVIOLET [J].
BARBEE, TW ;
MROWKA, S ;
HETTRICK, MC .
APPLIED OPTICS, 1985, 24 (06) :883-886
[3]   REDUCTION IMAGING AT 14 NM USING MULTILAYER-COATED OPTICS - PRINTING OF FEATURES SMALLER THAN 0.1-MU-M [J].
BJORKHOLM, JE ;
BOKOR, J ;
EICHNER, L ;
FREEMAN, RR ;
GREGUS, J ;
JEWELL, TE ;
MANSFIELD, WM ;
MACDOWELL, AA ;
RAAB, EL ;
SILFVAST, WT ;
SZETO, LH ;
TENNANT, DM ;
WASKIEWICZ, WK ;
WHITE, DL ;
WINDT, DL ;
WOOD, OR ;
BRUNING, JH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06) :1509-1513
[4]   ON SPINODAL DECOMPOSITION [J].
CAHN, JW .
ACTA METALLURGICA, 1961, 9 (09) :795-801
[5]  
Ceglio N M, 1989, J Xray Sci Technol, V1, P7, DOI 10.3233/XST-1989-1103
[6]   SOFT-X-RAY LASER CAVITIES [J].
CEGLIO, NM ;
STEARNS, DG ;
HAWRYLUK, AM ;
BARBEE, TW ;
DANZMANN, K ;
KUHNE, M ;
MUELLER, P ;
WENDE, B ;
STEARNS, MB ;
PETFORDLONG, AK ;
CHANG, CH .
JOURNAL DE PHYSIQUE, 1986, 47 (C-6) :277-286
[7]   MULTIPASS AMPLIFICATION OF SOFT X-RAYS IN A LASER CAVITY [J].
CEGLIO, NM ;
STEARNS, DG ;
GAINES, DP ;
HAWRYLUK, AM ;
TREBES, JE .
OPTICS LETTERS, 1988, 13 (02) :108-110
[8]  
CEGLIO NM, 1987, MULTILAYERED STRUCTU, V688
[9]  
CEGLIO NM, 1988, OSA P, V2, P357
[10]   MEASUREMENTS OF INTERDIFFUSIVITIES IN CU/NIFE TERNARY ALLOY THIN-FILMS [J].
CHAUDHURI, J ;
TSAKALAKOS, T .
ACTA METALLURGICA, 1985, 33 (10) :1939-1943