Field emission studies on well adhered pulsed laser deposited LaB6 on W tip

被引：54

作者：

Late, Dattatray J.

More, Mahendra A.

Joag, Dilip S. ^{[1
]}

Misra, Pankaj

Singh, B. N.

Kukreja, Lalit M.

机构：

[1] Univ Poona, Ctr Adv Studies Mat Sci & Condensed Matter Phys, Pune 411007, Maharashtra, India

[2] Raja Ramanna Ctr Advance Technol, Thin Film Lab, Indore 452013, India

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 12期

关键词：

D O I：

10.1063/1.2337999

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Lanthanum hexaboride films have been deposited on a tungsten tip by pulsed laser deposition technique. The field emission studies have been performed in the conventional field emission geometry. The Fowler-Nordheim plot obtained from the current-voltage characteristic is found to be linear in accordance with the quantum mechanical tunneling phenomenon. A current density of 1.2x10(4) A/cm(2) is drawn from the deposited tip. The field enhancement factor is calculated to be 5537 cm(-1), indicating that the field emission is from nanoscale protrusions present on emitter surface. The emission current-time plots show the very good stability of the emitter. (c) 2006 American Institute of Physics.

引用

页数：3

共 19 条

[1]

[Anonymous], FIELD EMISSION FIELD

[2]

CHRISEY DB, 1994, PULSED LASER DEPOSIT, P417

[3] Pulsed laser deposition of crystalline LaB6 thin films [J].