Fabrication of nano structures in thin membranes with focused ion beam technology

被引:15
作者
Gadgil, V. J. [1 ]
Tong, H. D. [1 ]
Cesa, Y. [1 ]
Bennink, M. L. [1 ]
机构
[1] Univ Twente, Inst Nanotechnol, MESA, NL-7500 AE Enschede, Netherlands
关键词
Nano pore; Dual beam FIB; Nano slit; Nano wire;
D O I
10.1016/j.surfcoat.2009.02.036
中图分类号
TB3 [工程材料学];
学科分类号
082905 [生物质能源与材料];
摘要
In recent years, Focused Ion Beam (FIB) technology has emerged as an important tool for nanotechnology [V.J. Gadgil, F. Morrissey, Encyclopaedia of Nanoscience and Nanotechnology, vol. 1, American Science Publishers, ISBN: 1-58883-057-8, 2004, p101.]. In this paper, applications of focused ion beam technology to fabrication of nanostructures are presented. The structures are fabricated on free standing silicon nitride membranes. Nanopores are nanometer diameter holes used in bio medical research for high speed DNA sequencing [D.K. Stewart. LA. Stern, G. Foss, G. Hughes and P. Govil, Proc. SPIE 21,1990,1263.]. FIB was used to mill narropores in the membrane. The pores were further reduced using epitaxial deposition using electron beam, at a controlled rate. A STEM detector was used to monitor the pore in situ. Nanowires can be fabricated using shadow mask technique. The shadow mask for nanowires was fabricated using FIB. The mask was used to produce nanowires. Fabrication method and FIB process parameters for the fabrication are reported. Results of the nanopore fabrication are presented with STEM images. Results of the nanowire fabrication are presented. Various strategies employed to achieve the desired nanostructures are discussed. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:2436 / 2441
页数:6
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