Tribological and mechanical properties of carbon nitride films deposited by ionised magnetron sputtering

被引:23
作者
Kusano, Y [1 ]
Barber, ZH [1 ]
Evetts, JE [1 ]
Hutchings, IM [1 ]
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
基金
英国工程与自然科学研究理事会;
关键词
carbon nitride; ionised magnetron sputtering; mechanical properties; tribological properties;
D O I
10.1016/S0257-8972(99)00645-3
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Tribological and mechanical properties were evaluated for carbon nitride films deposited by an ionised d.c. magnetron sputtering system in which an inductive plasma was generated between the graphite target and the substrate. Steady-state mean coefficients of friction against hard steel in ball-on-rotating disc tests were from 0.44 to 0.81 for films deposited with the inductive plasma, and from 0.36 to 0.60 without the inductive plasma. In each case, the friction increased with increasing nitrogen content in the sputtering gas and then reached a constant value. The elastic modulus of the films was deduced from nanoindentation experiments, and the residual strains in the films were estimated from specimen curvature measurements. The modulus of the films with no inductive plasma reached a maximum with 10 vol.% nitrogen in the sputtering gas, and decreased markedly with the inductive plasma. The modulus also decreased at higher pressures and higher substrate bias voltages. The strains in the films were always compressive, and increased when nitrogen was present in the sputtering gas. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:104 / 109
页数:6
相关论文
共 16 条
[1]   Incorporation of nitrogen in sputtered carbon films [J].
Axen, N ;
Botton, GA ;
Lou, HQ ;
Somekh, RE ;
Hutchings, IM .
SURFACE & COATINGS TECHNOLOGY, 1996, 81 (2-3) :262-268
[2]   A method for interpreting the data from depth-sensing indentation instruments [J].
Doerner, M. F. ;
Nix, W. D. .
JOURNAL OF MATERIALS RESEARCH, 1986, 1 (04) :601-609
[3]   A REVIEW OF THE PRESENT UNDERSTANDING OF THE ROLE OF ION SURFACE INTERACTIONS AND PHOTOINDUCED REACTIONS DURING VAPOR-PHASE CRYSTAL-GROWTH [J].
GREENE, JE ;
MOTOOKA, T ;
SUNDGREN, JE ;
ROCKETT, A ;
GORBATKIN, S ;
LUBBEN, D ;
BARNETT, SA .
JOURNAL OF CRYSTAL GROWTH, 1986, 79 (1-3) :19-32
[4]   Analysis of nanoindentation load-displacement loading curves [J].
Hainsworth, SV ;
Chandler, HW ;
Page, TF .
JOURNAL OF MATERIALS RESEARCH, 1996, 11 (08) :1987-1995
[5]   Microstructure control in semiconductor metallization [J].
Harper, JME ;
Rodbell, KP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (04) :763-779
[6]  
HU J, 1998, PHYS REV B, V57, P3185
[7]   Properties of carbon nitride films deposited by magnetron sputtering [J].
Kusano, Y ;
Evetts, JE ;
Somekh, RE ;
Hutchings, IM .
THIN SOLID FILMS, 1998, 332 (1-2) :56-61
[8]  
KUSANO Y, 1999, IN PRESS THIN SOLID
[9]   IONIZED MAGNETRON SPUTTER-DEPOSITION OF AMORPHOUS-CARBON NITRIDE THIN-FILMS [J].
LI, D ;
LOPEZ, S ;
CHUNG, YW ;
WONG, MS ;
SPROUL, WD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1995, 13 (03) :1063-1066
[10]  
LIU C, 1993, SCIENCE, V261, P334