Absolute measurement of penetration depth in a superconducting film by the two-coil technique

被引：13

作者：

Wang, RF

Zhao, SP

Chen, GH

Yang, QS

机构：

[1] Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China

[2] Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 24期

关键词：

D O I：

10.1063/1.125482

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A two-coil mutual-inductance apparatus that is optimized to allow for the measurement of the absolute value of penetration depth lambda in superconducting films is described. Nb films with thickness d ranging from 20 to 90 nm are used to illustrate the measurement. For a 70-nm-thick Nb film at 4.2 K, with d/lambda similar to 0.6, the uncertainty in the measured lambda is about +/- 2.3%. From the results on the Nb film series, we show that a satisfactory determination of the absolute value of lambda is possible for these films with d/lambda < 0.95. (C) 1999 American Institute of Physics. [S0003-6951(99)05146-3].

引用

收藏

页码：3865 / 3867

页数：3

相关论文

共 13 条

[1] OBSERVATION OF THE SUPERCONDUCTING PROXIMITY EFFECT FROM KINETIC-INDUCTANCE MEASUREMENTS [J].

CLAASSEN, JH ;

EVETTS, JE ;

SOMEKH, RE ;

BARBER, ZH .

PHYSICAL REVIEW B, 1991, 44 (17) :9605-9608

[2] SUPERCONDUCTING PROPERTIES OF HIGH-PURITY NIOBIUM [J].

FINNEMORE, DK ;

STROMBERG, TF ;

SWENSON, CA .

PHYSICAL REVIEW, 1966, 149 (01) :231-+

[3] RENORMALIZATION OF THE MEAN-FIELD SUPERCONDUCTING PENETRATION DEPTH IN EPITAXIAL YBA2CU3O7 FILMS [J].

FIORY, AT ;

HEBARD, AF ;

MANKIEWICH, PM ;

HOWARD, RE .

PHYSICAL REVIEW LETTERS, 1988, 61 (12) :1419-1422

[4] PENETRATION DEPTHS OF HIGH-TC FILMS MEASURED BY 2-COIL MUTUAL INDUCTANCES [J].

FIORY, AT ;

HEBARD, AF ;

MANKIEWICH, PM ;

HOWARD, RE .

APPLIED PHYSICS LETTERS, 1988, 52 (25) :2165-2167

[5] MAGNETIC PENETRATION DEPTH OF YBA2CU3O7 - REPLY [J].

GREENE, RL ;

KRUSINELBAUM, L ;

MALOZEMOFF, AP .

PHYSICAL REVIEW LETTERS, 1989, 62 (24) :2886-2886

[6] MAGNETIC PENETRATION DEPTH OF YBA2CU3O7 [J].

HEBARD, AF ;

FIORY, AT ;

HARSHMAN, DR .

PHYSICAL REVIEW LETTERS, 1989, 62 (24) :2885-2885

[7] Determining the absolute value of penetration depth of large area films [J].

Lee, JY ;

Kim, YH ;

Hahn, TS ;

Choi, SS .

APPLIED PHYSICS LETTERS, 1996, 69 (11) :1637-1639

[8] ELECTRICAL CHARACTERISTICS OF RF-SPUTTERED SINGLE-CRYSTAL NIOBIUM FILMS [J].

MAYADAS, AF ;

LAIBOWITZ, RB ;

CUOMO, JJ .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (03) :1287-+

[9] THICKNESS DEPENDENCE ON THE SUPERCONDUCTING PROPERTIES OF THIN NB FILMS [J].

MINHAJ, MSM ;

MEEPAGALA, S ;

CHEN, JT ;

WENGER, LE .

PHYSICAL REVIEW B, 1994, 49 (21) :15235-15240

[10] TC DEPRESSION IN THIN NB FILMS [J].

PARK, SI ;

GEBALLE, TH .

PHYSICA B & C, 1985, 135 (1-3) :108-112