Cobalt-Al2O3-silicon tunnel contacts for electrical spin injection into silicon

被引:14
作者
Min, B. C.
Lodder, J. C.
Jansen, R.
Motohashi, K.
机构
[1] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands
[2] Sony Corp, Sendai Technol Ctr, Tagajo, Miyagi 9850842, Japan
关键词
D O I
10.1063/1.2176317
中图分类号
O59 [应用物理学];
学科分类号
摘要
The resistance of Co-Al2O3-Si tunnel contacts for electrical spin injection from a ferromagnet into silicon is investigated. The contacts form a substantial Schottky barrier, 0.7 eV, which plays a dominant role in the electronic transport. On Si with a low doping concentration (similar to 10(15) cm(-3)), the contact resistance is affected by the Al2O3 tunnel barrier only in the forward bias. In the reverse bias (the spin injection condition), the Schottky barrier results in a very high contact resistance, similar to 10(2) Omega m(2). While the contact resistance is improved to similar to 10(-2) Omega m(2) using Si with a high doping concentration (similar to 5x10(19) cm(-3)), it is still about five to six orders of magnitude higher than the value needed for resistance matching to silicon. (C) 2006 American Institute of Physics.
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页数:3
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