XPS characterization of nitrogen-doped carbon nanotubes

被引:114
作者
Morant, C. [1 ]
Andrey, J. [1 ]
Prieto, P. [1 ]
Mendiola, D. [1 ]
Sanz, J. M. [1 ]
Elizalde, E. [1 ]
机构
[1] Univ Autonoma Madrid, Dept Fis Aplicada, E-28049 Madrid, Spain
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2006年 / 203卷 / 06期
关键词
D O I
10.1002/pssa.200566110
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this work, CNTs have been bombarded with low energy N ions. X-ray photoelectron spectroscopy have been used to determine the binding configuration of the N-doped CNTs. AFM was also used to determine their morphology and mechanical properties. The same morphology is maintained after the N-2(+) bombardment. XPS analysis shows that the N Is core level spectra for N-doped CNTs can be deconvoluted in terms of two peaks related to sp(2) (C-N=C) and sp(3) hybridization (C-N configuration). This interpretation is in concordance with the increase of the hardness observed by AFM nanoindentations when the sp(3) contributions increase. (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:1069 / 1075
页数:7
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