Ferroelectric catastrophe: beyond nanometre-scale optical resolution

被引：63

作者：

Tominaga, J ^{[1
]}

Shima, T ^{[1
]}

Kuwahara, M ^{[1
]}

Fukaya, T ^{[1
]}

Kolobov, A ^{[1
]}

Nakano, T ^{[1
]}

机构：

[1] AIST, CAN FOR, Tsukuba, Ibaraki 3058562, Japan

来源：

NANOTECHNOLOGY | 2004年 / 15卷 / 05期

关键词：

D O I：

10.1088/0957-4484/15/5/001

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The optical diffraction limit is rigidly determined as a simple equation of wavelength. and lens numerical aperture NA (less than or equal to 1): lambda/2/NA. In this paper, we report that Ag5.8In4.4Sb61.0Te28.8 and Ge2Sb2Te5 chalcogenide thin films, which are typical of optical recording materials used in digital versatile discs (DVDs), enable a resolution of under lambda/10 due to their ferroelectric properties. In the Ag5.8In4.4Sb61.0Te28.8 film it was found that this optical super-resolution can be observed between 350 and 400 degreesC, resulting in a second phase transition from a hexagonal (A7 belonging to R (3) over barm) to a rhombohedral structure of R32 or R3m. In Ge2Sb2Te5, on the other hand, the temperature range is much wider, between 250 and 450degreesC, which is also due to a second phase transition from a NaCl-type fcc to a hexagonal structure.

引用

页码：411 / 415

页数：5

共 24 条

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