Dielectric loss of SrTiO3 single crystals under direct current bias

被引：37

作者：

Ang, C ^{[1
]}

Bhalla, AS ^{[1
]}

Guo, R ^{[1
]}

Cross, LE ^{[1
]}

机构：

[1] Penn State Univ, Mat Res Lab, University Pk, PA 16802 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 14期

关键词：

D O I：

10.1063/1.126215

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The dielectric behavior of SrTiO3 single crystals under high dc electric field (up to 50 kV/cm) is reported in this letter. The rounded dielectric constant peaks are induced by the application of dc bias, and the corresponding dielectric losses are observed. The results show that dielectric loss under dc bias consists of several components coming from "defects mode" and "induced mode." The field dependence of these modes is studied and their physical nature is discussed. (C) 2000 American Institute of Physics. [S0003-6951(00)04314-X].

引用

页码：1929 / 1931

页数：3

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