X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films

被引：159

作者：

Kim, JS

Ho, PKH

Thomas, DS

Friend, RH

Cacialli, F

Bao, GW

Li, SFY

机构：

[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England

[2] Natl Univ Singapore, Inst Mat Res & Engn, Singapore 119260, Singapore

[3] Natl Univ Singapore, Dept Chem, Singapore 119260, Singapore

来源：

CHEMICAL PHYSICS LETTERS | 1999年 / 315卷 / 5-6期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1016/S0009-2614(99)01233-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Angle-resolved X-ray photoelectron spectroscopy and photothermal deflection spectroscopy are used to study the oxygen-plasma or aquaregia treated indium-tin oxide (ITO) anodes for organic light-emitting diodes. Detailed analysis of the Ols core-level spectra and their dependence on photoemission angle was performed. The results indicate the presence of different chemical forms of oxygen atoms (two types of O2-, OH-, organic oxygens and H2O) which evolve with surface treatment. We find that the treatments lead to a modification of the surface chemical states and therefore of the physico-chemical properties of ITO, which in turn control the performance of organic light-emitting diodes. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：307 / 312

页数：6

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