Polycrystalline silicon thin-film transistors: A continuous evolving technology

被引:60
作者
Fortunato, G
机构
[1] IESS-CNR, 00156 Roma
关键词
circuit application; electrical instabilities; noise performance;
D O I
10.1016/S0040-6090(96)09378-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Polysilicon thin-film transistors (TFTs) are of great interest for their application in large area microelectronics and in particular for active matrix liquid crystal displays. This is owing to the improved performances of polysilicon TFTs that allow the fabrication of active matrix devices with integrated driving circuitry. The progressive improvement of this technology has been related to the optimization of the polysilicon active layer, first deposited by LPCVD, then obtained by solid phase crystallization of amorphous silicon and, more recently, by excimer laser crystallization of amorphous silicon. For circuit application there is a strong demand for high performances, high stability and low noise devices. Some specific aspects of the electrical characteristics of the polysilicon TFTs and related to their circuit application are also discussed, including the electrical instabilities induced by hot-carrier effects, the anomalous drain current increase occurring at high source-drain voltages (called ''kink'' effect) and the low-frequency noise performances. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:82 / 90
页数:9
相关论文
共 58 条
[1]   CHARACTERIZATION OF TRAPPING STATES IN POLYCRYSTALLINE-SILICON THIN-FILM TRANSISTORS BY DEEP-LEVEL TRANSIENT SPECTROSCOPY [J].
AYRES, JR .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (03) :1787-1792
[2]   HOT-CARRIER EFFECTS IN DEVICES AND CIRCUITS FORMED FROM POLY-SI [J].
AYRES, JR ;
YOUNG, ND .
IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, 1994, 141 (01) :38-44
[3]   LOW-TEMPERATURE CRYSTALLIZATION OF AMORPHOUS-SILICON USING AN EXCIMER LASER [J].
BACHRACH, RZ ;
WINER, K ;
BOYCE, JB ;
READY, SE ;
JOHNSON, RI ;
ANDERSON, GB .
JOURNAL OF ELECTRONIC MATERIALS, 1990, 19 (03) :241-248
[4]   EXCIMER-LASER-ANNEALED POLY-SI THIN-FILM TRANSISTORS [J].
BROTHERTON, SD ;
MCCULLOCH, DJ ;
CLEGG, JB ;
GOWERS, JP .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (02) :407-413
[5]   POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS [J].
BROTHERTON, SD .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1995, 10 (06) :721-738
[6]   CHARACTERIZATION OF LOW-TEMPERATURE POLY-SI THIN-FILM TRANSISTORS [J].
BROTHERTON, SD ;
AYRES, JR ;
YOUNG, ND .
SOLID-STATE ELECTRONICS, 1991, 34 (07) :671-679
[7]  
BROTHERTON SD, 1995, PHYSICAL TECHNICAL P, P183
[8]  
BRYER NJ, 1984, P EURODISPLAY 84, P23
[9]   MICROSTRUCTURE OF POLYCRYSTALLINE SILICON FILMS OBTAINED BY COMBINED FURNACE AND LASER ANNEALING [J].
CARLUCCIO, R ;
STOEMENOS, J ;
FORTUNATO, G ;
MEAKIN, DB ;
BIANCONI, M .
APPLIED PHYSICS LETTERS, 1995, 66 (11) :1394-1396
[10]   DRASTIC ENLARGEMENT OF GRAIN-SIZE OF EXCIMER-LASER-CRYSTALLIZED POLYSILICON FILMS [J].
CHOI, DH ;
SHIMIZU, K ;
SUGIURA, O ;
MATSUMURA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (12B) :4545-4549